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Atomic Force Microscopy by Voigtländer, Bert

Table of Contents: “…Introduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.…”
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Compendium of Surface and Interface Analysis

Table of Contents: “…Acoustic Microscopy -- Action Spectroscopy with STM -- Ambient Pressure X-ray Photoelectron Spectroscopy -- Angle-resolved Ultraviolet Photoelectron Spectroscopy -- Atom Probe Field Ion Microscope -- Atomic Force Microscope -- Auger electron spectroscopy -- Cathodoluminescence -- Conductive Atomic Force Microscopy -- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy -- Dynamic Secondary Ion Mass Spectrometry -- Elastic Recoil Detection Analysis -- Electrochemical Atomic Force Microscopy -- Electrochemical Infrared Spectroscopy -- Electrochemical Scanning Tunneling Microscopy -- Electrochemical Second Harmonic Generation -- Electrochemical Sum Frequency Generation -- Electrochemical Surface X-ray Scattering -- Electrochemical Transmission Electron Microscopy -- Electrochemical X-ray Absorption Fine Structure -- Electrochemical X-ray Photoelectron Spectroscopy -- Electron Backscatter Diffraction -- Electron Energy Loss Spectroscopy -- Electron Probe Microanalysis -- Electron Stimulated Desorption -- Electron-beam-induced current -- Ellipsometry -- Environmental SEM (Atmospheric SEM) -- Environmental Transmission Electron Microscopy -- Extended X-ray Absorption Fine Structure -- Focused Ion Beam Scanning Electron Microscope -- Force Curve -- Force Spectroscopy -- Frequency-Modulation Atomic Force Microscopy -- Gap Mode Raman Spectroscopy -- Glow Discharge Mass Spectrometry -- Glow Discharge Optical Emission Spectrometry -- Hard X-ray Photoelectron Spectroscopy -- Helium Atom Scattering -- High-resolution Elastic Recoil Detection Analysis -- High-resolution electron energy loss spectroscopy -- High-resolution Rutherford Backscattering Spectrometry -- High-Speed Atomic Force Microscopy -- Imaging Ellipsometry -- Impact Collision Ion Scattering Spectroscopy -- Inelastic Electron Tunneling Spectroscopy -- Infrared External-Reflection Spectroscopy -- Infrared Reflection Absorption Spectroscopy -- Interferometer displacement measurement -- Inverse Photoemission Spectroscopy -- Kelvin Probe Force Microscope -- Laser Ionization Secondary Neutral Mass Spectrometry -- Laser Photoelectron Spectroscopy -- Lateral Force Microscopy -- Liquid SPM/AFM -- Low Energy Ion Scattering Spectroscopy -- Low-Energy Electron Diffraction -- Low-Energy Electron Microscope -- Magnetic Force Microscopy -- Matrix-Assisted Laser Desorption/Ionization -- Medium Energy Ion Scattering -- Micro Raman Spectroscopy -- Microprobe Reflection High Energy Electron Diffraction -- Multiple-probe Scanning Probe Microscope -- Nanoscale Angle-resolved Photoelectron Spectroscopy -- Nonlinear Spectroscopy -- Nuclear Reaction Analysis -- Optical Microscopy -- Optical second harmonic generation spectroscopy and microscopy -- Particle Induced X-ray Emission -- Penning Ionization Electron Spectroscopy -- Phase Mode SPM/AFM -- Photoelectron diffraction -- Photoelectron holography -- Photoelectron Yield Spectroscopy -- Photoemission Electron Microscope -- Photoluminescence -- Photon Emission from the Scanning Tunneling Microscope -- Photo-StimulatedDesorption -- Piezoresponse Force Microscope -- Positron-Annihilation-Induced Desorption -- p-Polarized Multiple-Angle Incidence Resolution Spectrometry -- Quartz Crystal Microbalance -- Reflectance Difference Spectroscopy -- Reflection High-Energy Electron Diffraction -- Resonant Inelastic X-ray Scattering -- Rutherford Backscattering Spectrometry -- Scanning Capacitance Microscopy -- Scanning Electrochemical Microscopy -- Scanning Electron Microscope Energy Dispersive X-ray Spectrometry -- Scanning Electron Microscopy -- Scanning Helium Ion Microscope -- Scanning Near-field Optical Microscopy/ Near-field Scanning Optical Microscopy -- Scanning Probe Microscopy -- Scanning Transmission Electron Microscopy -- Scanning Transmission X-ray Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy -- Soft X-ray Absorption Fine Structure -- Spectroscopic Ellipsometry -- Spin- and Angle-resolved Photoelectron Spectroscopy -- Spin-Polarized Scanning Electron Microscopy -- Spin-Polarized ScanningTunneling Microscopy -- Spin-resolved Photoemission Electron Microscopy -- Super-resolution Microscopy -- Surface acoustic wave -- Surface Enhanced Raman Scattering -- Surface Magneto-optic Kerr Effect -- Surface Plasmon Resonance -- Surface Profilometer -- Surface Sensitive Scanning Electron Microscopy -- Surface X-ray Diffraction -- Surface-enhanced Infrared Absorption Spectroscopy -- Synchrotron Radiation Photoelectron Spectroscopy -- Synchrotron Scanning Tunneling Microscope -- Thermal desorption spectroscopy -- Time-of-Flight Secondary Ion Mass Spectrometry -- Time-resolved Photoelectron Spectroscopy -- Time-resolved Photoemission Electron Microscopy -- Time-resolved Scanning Tunneling Microscopy -- Tip-Enhanced Raman Scattering -- Total Reflection X-Ray Fluorescence -- Transmission Electron Diffraction -- Transmission Electron Microscope -- Ultraviolet Photoelectron Spectroscopy -- Ultraviolet-visible spectrophotometry -- Vibrational Sum Frequency Generation Spectroscopy -- X-ray Absorption Near Edge Structure -- X-ray aided noncontact atomic force microscopy -- X-ray Crystal Truncation Rod Scattering -- X-ray Magnetic Circular Dichroism -- X-ray Photoelectron Spectroscopy -- X-Ray Reflectivity -- X-ray Standing Wave Method.…”
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The Ascent of GIM, the Global Intelligent Machine A History of Production and Information Machines / by Koetsier, Teun

Table of Contents: “…Preface -- 1 Introduction -- The Global Intelligent Machine -- Cultural evolution -- Production technology and information technology -- 2 The Rise of Homo Sapiens -- Animals using production tools -- Monkeys and apes using production tools -- Information tools in the animal world: clues, signs and signals -- Communicating honey bees -- Communication among monkeys and apes -- From the hairpin ancestor to Homo sapiens -- Olduwan technology -- The adze makers of Langda -- Language as an information tool -- The control of fire -- The Stone Age Revolution -- Information tools -- Whistle languages -- Talking drums -- The Ishango bone -- Orientation in space, maps in the Pacific -- 3 Tools in the Early Agricultural Empires -- Economic surplus -- Agriculture -- The wheel -- Monumental architecture -- Complete writing -- Towards the alphabet -- Mathematics -- Sundials and water clocks -- 4 The Axial Age and the Birth of Western Science -- The Axial Age -- The rise of abstract symbolic thought in China and India -- Oral versus written thought -- Aristotle's Logic, a New Information Tool -- Knowledge-how versus knowledge-that -- Deductive science -- The birth of the theory of machines -- The wedge and the pulleys -- Archimedes -- The invention of the screw -- Heron's Mechanics -- Combinations of simple machines -- Difficulties in understanding the wedge and the inclined plane -- 5 Machines in Classical Antiquity -- The invention of artillery -- Production machines in Vitruvius' Ten Books on Architecture -- The Phaistos disc -- The abacus -- Water clocks and sundials -- The Armillary Sphere -- The anaphoric clock -- The astrolabe -- The mystery of the Antikythera mechanism -- The front dial -- The upper back dial -- The pin and slot mechanism -- The hodometer -- Automata -- 6 The Middle Ages -- Marco Polo -- Textile machines -- Military technology -- Metal technology -- Movable type printing -- The hodometer and Su Sung's clock -- Automata -- Chinese influence in the West -- The Golden Age of Islamic Science -- Islamic culture, the information machines of the three Banu Musa -- Al-Jazari's production machines -- Al-Muradi -- The rise of the West -- Jordanus -- The Vision of Ramon Llull -- The invention of the printing press -- Llull's influence -- A new information machine: the mechanical clock -- 7 The Renaissance and the Scientific Revolution -- The impact of the printing press -- Da Vinci and the others -- Parachute, tank and machine gun -- Da Vinci as an engineer -- Da Vinci's fame -- Theaters of machines -- Exterior ballistics -- Del Monte and simple machines -- Galilei and simple machines -- The Archimedean screw pump -- Astronomy -- Galilei's Discorsi -- A remarkable Flemish engineer: Simon Stevin -- There is more -- The dream of a mathesis universalis -- Calculators -- Scepticism -- 8 The First Wave of Industrial Revolution: Cotton Textiles and Pig Iron -- The background -- The role of the Scientific Revolution -- A macroeconomic view of the Industrial Revolution -- The Malthusian trap -- The escape -- One or more Industrial Revolutions? …”
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