Atomic Force Microscopy

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...

Ful tanımlama

Detaylı Bibliyografya
Yazar: Voigtländer, Bert (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edisyon:2nd ed. 2019.
Seri Bilgileri:NanoScience and Technology,
Konular:
Spectrum analysis.
Nanotechnology.
Microtechnology.
Microelectromechanical systems.
Nanoscience.
Biophysics.
Spectroscopy.
Microsystems and MEMS.
Nanophysics.
Bioanalysis and Bioimaging.
Online Erişim:Full-text access
OPAC'ta görüntüle

Internet

Full-text access
OPAC'ta görüntüle

Merkez Kütüphane

Detaylı Erişim Bilgileri Merkez Kütüphane
Kopya Bilgisi UnknownBarcode

Benzer Materyaller