Atomic Force Microscopy

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...

Full description

Bibliographic Details
Main Author: Voigtländer, Bert (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:2nd ed. 2019.
Series:NanoScience and Technology,
Subjects:
Spectrum analysis.
Nanotechnology.
Microtechnology.
Microelectromechanical systems.
Nanoscience.
Biophysics.
Spectroscopy.
Microsystems and MEMS.
Nanophysics.
Bioanalysis and Bioimaging.
Online Access:Full-text access
View in OPAC

Internet

Full-text access
View in OPAC

Merkez Kütüphane

Holdings details from Merkez Kütüphane
Copy UnknownBarcode

Similar Items