Atomic Force Microscopy

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...

Ful tanımlama

Detaylı Bibliyografya
Yazar: Voigtländer, Bert (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edisyon:2nd ed. 2019.
Seri Bilgileri:NanoScience and Technology,
Konular:
Spectrum analysis.
Nanotechnology.
Microtechnology.
Microelectromechanical systems.
Nanoscience.
Biophysics.
Spectroscopy.
Microsystems and MEMS.
Nanophysics.
Bioanalysis and Bioimaging.
Online Erişim:Full-text access
OPAC'ta görüntüle
İçindekiler:
  • Introduction
  • Part I: Scanning Probe Microscopy Instrumentation
  • Harmonic Oscillator
  • Technical Aspects of Scanning Probe Microscopy
  • Scanning Probe Microscopy Designs
  • Electronics for Scanning Probe Microscopy
  • Lock-In Technique
  • Data Representation and Image Processing
  • Artifacts in SPM
  • Work Function, Contact Potential, and Kelvin Probe
  • Part II: Atomic Force Microscopy (AFM)
  • Forces between Tip and Sample
  • Technical Aspects of Atomic Force Microscopy
  • Static Atomic Force Microscopy
  • Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
  • Intermittent Contact Mode/Tapping Mode
  • Mapping of Mechanical Properties Using Force-Distance
  • Frequency Modulation (FM) Mode in Dynamic Atomic Force
  • Noise in Atomic Force Microscopy
  • Quartz Sensors in Atomic Force Microscopy.

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