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Helium Ion Microscopy
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are di...
Müşterek Yazar: | SpringerLink (Online service) |
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Diğer Yazarlar: | Hlawacek, Gregor (Editör), Gölzhäuser, Armin (Editör) |
Materyal Türü: | e-Kitap |
Dil: | İngilizce |
Baskı/Yayın Bilgisi: |
Cham :
Springer International Publishing :
2016.
Imprint: Springer, |
Edisyon: | 1st ed. 2016. |
Seri Bilgileri: | NanoScience and Technology,
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Konular: | |
Online Erişim: | Full-text access |
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