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Test Generation of Crosstalk Delay Faults in VLSI Circuits

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on cu...

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Bibliographic Details
Main Authors:	Jayanthy, S. (Author), Bhuvaneswari, M.C (Author)
Corporate Author:	SpringerLink (Online service)
Format:	e-Book
Language:	English
Published:	Singapore : Springer Nature Singapore : 2019. Imprint: Springer,
Edition:	1st ed. 2019.
Subjects:	Electronic circuits. Microprogramming . Computers. Logic design. Electronic Circuits and Systems. Control Structures and Microprogramming. Hardware Performance and Reliability. Logic Design.
Online Access:	Full-text access

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