Test Generation of Crosstalk Delay Faults in VLSI Circuits

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on cu...

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Bibliographic Details
Main Authors: Jayanthy, S. (Author), Bhuvaneswari, M.C (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Singapore : Springer Nature Singapore : Imprint: Springer, 2019.
Edition:1st ed. 2019.
Subjects:
Electronic circuits.
Microprogramming .
Computers.
Logic design.
Electronic Circuits and Systems.
Control Structures and Microprogramming.
Hardware Performance and Reliability.
Logic Design.
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