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Electrical Atomic Force Microscopy for Nanoelectronics
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabricatio...
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Diğer Yazarlar: | |
Materyal Türü: | e-Kitap |
Dil: | İngilizce |
Baskı/Yayın Bilgisi: |
Cham :
Springer International Publishing : Imprint: Springer,
2019.
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Edisyon: | 1st ed. 2019. |
Seri Bilgileri: | NanoScience and Technology,
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Konular: | |
Online Erişim: | Full-text access OPAC'ta görüntüle |
Internet
Full-text accessOPAC'ta görüntüle
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