Electrical Atomic Force Microscopy for Nanoelectronics

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabricatio...

Ful tanımlama

Detaylı Bibliyografya
Müşterek Yazar: SpringerLink (Online service)
Diğer Yazarlar: Celano, Umberto (Editör)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : 2019.
Imprint: Springer,
Edisyon:1st ed. 2019.
Seri Bilgileri:NanoScience and Technology,
Konular:
Spectrum analysis.
Materials > Analysis.
Electronics.
Optical materials.
Nanoscience.
Nanotechnology.
Spectroscopy.
Characterization and Analytical Technique.
Electronics and Microelectronics, Instrumentation.
Optical Materials.
Nanophysics.
Online Erişim:Full-text access

Internet

Full-text access

Merkez Kütüphane

Detaylı Erişim Bilgileri Merkez Kütüphane
Kopya Bilgisi UnknownBarcode

Benzer Materyaller