Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS /

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...

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Detaylı Bibliyografya
Asıl Yazarlar: Posser, Gracieli (Yazar), Sapatnekar, Sachin S. (Yazar), Reis, Ricardo (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : 2017.
Imprint: Springer,
Edisyon:1st ed. 2017.
Konular:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Processor Architectures.
Online Erişim:Full-text access
İçindekiler:
  • Chapter 1. Introduction
  • Chapter 2. State of the Art
  • Chapter 3. Modeling Cell-internal EM
  • Chapter 4. Current Calculation
  • Chapter 5. Experimental Setup
  • Chapter 6.Results
  • Chapter 7. Analyzing the Electromigration Effects on Different Metal Layers
  • Chapter 8. Conclusions.

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