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Contactless VLSI Measurement and Testing Techniques

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approach...

Detaylı Bibliyografya
Yazar:	Sayil, Selahattin (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	e-Kitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	Cham : Springer International Publishing : Imprint: Springer, 2018.
Edisyon:	1st ed. 2018.
Konular:	Electronic circuits. Microprocessors. Computer architecture. Electronics. Electronic Circuits and Systems. Processor Architectures. Electronics and Microelectronics, Instrumentation.
Online Erişim:	Full-text access OPAC'ta görüntüle

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