Contactless VLSI Measurement and Testing Techniques

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approach...

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Detaylı Bibliyografya
Yazar: Sayil, Selahattin (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edisyon:1st ed. 2018.
Konular:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronics.
Electronic Circuits and Systems.
Processor Architectures.
Electronics and Microelectronics, Instrumentation.
Online Erişim:Full-text access
OPAC'ta görüntüle
İçindekiler:
  • 1. Conventional Test Methods. - 2. Testability Design
  • 3. Other Techniques Based on the Contacting Probe
  • 4. Contactless Testing
  • 5. Electron-Beam and Photoemission Probing
  • 6. Electro Optic Sampling and Charge Density Probe
  • 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe
  • 8. Probing Techniques Based on Light Emission from Chip
  • 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits
  • 10. Comparison of Contactless Testing Methodologies.

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