Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms /

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the...

Ful tanımlama

Detaylı Bibliyografya
Asıl Yazarlar: Borja, Juan Pablo (Yazar), Lu, Toh-Ming (Yazar), Plawsky, Joel (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : 2016.
Imprint: Springer,
Edisyon:1st ed. 2016.
Seri Bilgileri:SpringerBriefs in Materials,
Konular:
Optical materials.
Microtechnology.
Microelectromechanical systems.
Electronic circuits.
Nanotechnology.
Optical Materials.
Microsystems and MEMS.
Electronic Circuits and Systems.
Online Erişim:Full-text access

Internet

Full-text access

Merkez Kütüphane

Detaylı Erişim Bilgileri Merkez Kütüphane
Kopya Bilgisi UnknownBarcode

Benzer Materyaller