APA (7. basım) Alıntı

Borja, J. P., Lu, T., & Plawsky, J. (2016). Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (1st ed. 2016.). Springer International Publishing. https://doi.org/10.1007/978-3-319-43220-5

Chicago Style (17. basım) Atıf

Borja, Juan Pablo, Toh-Ming Lu, ve Joel Plawsky. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. 1st ed. 2016. Cham: Springer International Publishing, 2016. https://doi.org/10.1007/978-3-319-43220-5.

MLA (9th ed.) Atıf

Borja, Juan Pablo, et al. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. 1st ed. 2016. Springer International Publishing, 2016. https://doi.org/10.1007/978-3-319-43220-5.