Tantalum and Niobium-Based Capacitors Science, Technology, and Applications /

This book provides a comprehensive analysis of the science, technology, and applications of Tantalum and Niobium-based capacitors. The author discusses fundamentals, focusing on thermodynamic stability, major degradation processes and conduction mechanisms in the basic structure of Me-Me2O5-cathode...

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Bibliographic Details
Main Author: Freeman, Yuri (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Subjects:
Electronic circuits.
Electronics.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Online Access:Full-text access
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Table of Contents:
  • Introduction
  • Chap1:  Major Degradation Mechanisms
  • Chap2: Basic Technology
  • Chap3: Applications
  • Conclusion.

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