Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...

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Detaylı Bibliyografya
Asıl Yazarlar: Brodusch, Nicolas (Yazar), Demers, Hendrix (Yazar), Gauvin, Raynald (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Singapore : Springer Nature Singapore : Imprint: Springer, 2018.
Edisyon:1st ed. 2018.
Seri Bilgileri:SpringerBriefs in Applied Sciences and Technology,
Konular:
Materials > Analysis.
Spectrum analysis.
Microtechnology.
Microelectromechanical systems.
Characterization and Analytical Technique.
Spectroscopy.
Microsystems and MEMS.
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