Soft Error Mechanisms, Modeling and Mitigation

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes...

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Bibliographic Details
Main Author: Sayil, Selahattin (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : 2016.
Imprint: Springer,
Edition:1st ed. 2016.
Subjects:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Processor Architectures.
Online Access:Full-text access
Table of Contents:
  • Introduction
  • Mitigation of Single Event Effects
  • Transmission Gate (TG) Based Soft Error Mitigation Methods
  • Single Event Soft Error Mechanisms
  • Modeling Single Event Crosstalk Noise in Nanometer Technologies
  • Modeling of Single Event Coupling Delay and Speedup Effects
  • Single Event Upset Hardening of Interconnects
  • Soft-Error Aware Power Optimization
  • Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.

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