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Knowledge-Driven Board-Level Functional Fault Diagnosis

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to...

Detaylı Bibliyografya
Asıl Yazarlar:	Ye, Fangming (Yazar), Zhang, Zhaobo (Yazar), Chakrabarty, Krishnendu (Yazar), Gu, Xinli (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	e-Kitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	Cham : Springer International Publishing : 2017. Imprint: Springer,
Edisyon:	1st ed. 2017.
Konular:	Electronic circuits. Data mining. Electronics. Electronic Circuits and Systems. Data Mining and Knowledge Discovery. Electronics and Microelectronics, Instrumentation.
Online Erişim:	Full-text access

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