Knowledge-Driven Board-Level Functional Fault Diagnosis

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to...

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Bibliographic Details
Main Authors: Ye, Fangming (Author), Zhang, Zhaobo (Author), Chakrabarty, Krishnendu (Author), Gu, Xinli (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : 2017.
Imprint: Springer,
Edition:1st ed. 2017.
Subjects:
Electronic circuits.
Data mining.
Electronics.
Electronic Circuits and Systems.
Data Mining and Knowledge Discovery.
Electronics and Microelectronics, Instrumentation.
Online Access:Full-text access

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