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Scanning Electron Microscopy and X-Ray Microanalysis

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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...

Detaylı Bibliyografya
Asıl Yazarlar:	Goldstein, Joseph I. (Yazar), Newbury, Dale E. (Yazar), Michael, Joseph R. (Yazar), Ritchie, Nicholas W.M (Yazar), Scott, John Henry J. (Yazar), Joy, David C. (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	e-Kitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	New York, NY : Springer New York : Imprint: Springer, 2018.
Edisyon:	4th ed. 2018.
Konular:	Materials > Analysis. Spectrum analysis. Biophysics. Measurement. Measuring instruments. Characterization and Analytical Technique. Spectroscopy. Bioanalysis and Bioimaging. Measurement Science and Instrumentation.
Online Erişim:	Full-text access OPAC'ta görüntüle

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