Scanning Electron Microscopy and X-Ray Microanalysis

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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...

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Detaylı Bibliyografya
Asıl Yazarlar: Goldstein, Joseph I. (Yazar), Newbury, Dale E. (Yazar), Michael, Joseph R. (Yazar), Ritchie, Nicholas W.M (Yazar), Scott, John Henry J. (Yazar), Joy, David C. (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: New York, NY : Springer New York : Imprint: Springer, 2018.
Edisyon:4th ed. 2018.
Konular:
Materials > Analysis.
Spectrum analysis.
Biophysics.
Measurement.
Measuring instruments.
Characterization and Analytical Technique.
Spectroscopy.
Bioanalysis and Bioimaging.
Measurement Science and Instrumentation.
Online Erişim:Full-text access
OPAC'ta görüntüle
İçindekiler:
  • Preface
  • Scanning Electron Microscopy and Associated Techniques: Overview
  • Electron Beam - Specimen Interactions: Interaction Volume
  • Backscattered Electrons
  • Secondary Electrons
  • X-rays
  • SEM Instrumentation
  • Image Formation
  • SEM Image Interpretation
  • The Visibility of Features in SEM Images
  • Image Defects
  • High resolution imaging
  • Low Beam Energy SEM
  • Variable Pressure Scanning Electron Microscopy (VPSEM)
  • ImageJ and Fiji
  • SEM Imaging checklist
  • SEM Case Studies
  • Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters
  • DTSA-II EDS Software
  • Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry
  • Quantitative Analysis: from k-ratio to Composition
  • Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step
  • Trace Analysis by SEM/EDS
  • Low Beam Energy X-ray Microanalysis
  • Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles
  • CompositionalMapping
  • Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM)
  • Energy Dispersive X-ray Microanalysis Checklist
  • X-ray Microanalysis Case Studies
  • Cathodoluminescence
  • Characterizing crystalline materials in the SEM
  • Focused Ion Beam Applications in the SEM laboratory
  • Ion Beam Microscopy
  • Appendix - A Database of Electron-Solid Interactions
  • Index.

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