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High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliabilit...

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Detaylı Bibliyografya
Asıl Yazarlar: Wang, Zheng (Yazar), Chattopadhyay, Anupam (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Singapore : Springer Nature Singapore : 2018.
Imprint: Springer,
Edisyon:1st ed. 2018.
Seri Bilgileri:Computer Architecture and Design Methodologies,
Konular:
Online Erişim:Full-text access

Internet

Full-text access

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