High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliabilit...

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Bibliographic Details
Main Authors: Wang, Zheng (Author), Chattopadhyay, Anupam (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Singapore : Springer Nature Singapore : 2018.
Imprint: Springer,
Edition:1st ed. 2018.
Series:Computer Architecture and Design Methodologies,
Subjects:
Electronic circuits.
Computers.
Electronic Circuits and Systems.
Hardware Performance and Reliability.
Online Access:Full-text access

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