Loading…

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

Bibliographic Details
Main Author: Egerton, R. F.
Format: Book
Language:Turkish
English
Published: New York, NY : Springer, 2005.
Subjects:
Online Access:View in OPAC

Internet

View in OPAC

Merkez Kütüphane

Holdings details from Merkez Kütüphane
Call Number: QH212 E4 E347 2005
Copy Rafta