Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

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Bibliographic Details
Main Author: Egerton, R. F.
Format: Book
Language:Turkish
English
Published: New York, NY : Springer, 2005.
Subjects:
Electron microscopy.
Elektron mikroskopisi.
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Merkez Kütüphane

Holdings details from Merkez Kütüphane
Call Number: QH212 E4 E347 2005
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