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Electron microscopy and analysis /

Bibliographic Details
Main Author:	Goodhew, Peter J.
Other Authors:	Humphreys, F. J., Beanland, R.
Format:	Book
Language:	English
Published:	London : Taylor & Francis, 2001.
Edition:	3. baskı
Subjects:	Electron microscopy. Elektron mikroskopisi.
Online Access:	View in OPAC

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