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Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms /

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the...

Detaylı Bibliyografya
Asıl Yazarlar:	Borja, Juan Pablo (Yazar), Lu, Toh-Ming (Yazar), Plawsky, Joel (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	e-Kitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	Cham : Springer International Publishing : Imprint: Springer, 2016.
Edisyon:	1st ed. 2016.
Seri Bilgileri:	SpringerBriefs in Materials,
Konular:	Optical materials. Microtechnology. Microelectromechanical systems. Electronic circuits. Nanotechnology. Optical Materials. Microsystems and MEMS. Electronic Circuits and Systems.
Online Erişim:	Full-text access OPAC'ta görüntüle

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