Loading…
Scanning Electron Microscopy and X-Ray Microanalysis
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...
| Main Authors: | , , , , , |
|---|---|
| Corporate Author: | |
| Format: | e-Book |
| Language: | English |
| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2018.
|
| Edition: | 4th ed. 2018. |
| Subjects: | |
| Online Access: | Full-text access View in OPAC |