Scanning Electron Microscopy and X-Ray Microanalysis

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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...

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Bibliographic Details
Main Authors: Goldstein, Joseph I. (Author), Newbury, Dale E. (Author), Michael, Joseph R. (Author), Ritchie, Nicholas W.M (Author), Scott, John Henry J. (Author), Joy, David C. (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2018.
Edition:4th ed. 2018.
Subjects:
Materials > Analysis.
Spectrum analysis.
Biophysics.
Measurement.
Measuring instruments.
Characterization and Analytical Technique.
Spectroscopy.
Bioanalysis and Bioimaging.
Measurement Science and Instrumentation.
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