Loading…

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

Bibliographic Details
Main Author: Egerton, R. F.
Format: Book
Language:Turkish
English
Published: New York, NY : Springer, 2005.
Subjects:
Online Access:View in OPAC
Description
Item Description:Dizin : 197-202 s.
Physical Description:xii, 202 sayfa ; 25 cm.
Bibliography:Kaynakça : 195-196 s.
ISBN:9780387258003