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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
Main Author: | |
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Format: | Book |
Language: | Turkish English |
Published: |
New York, NY :
Springer,
2005.
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Subjects: | |
Online Access: | View in OPAC |
Item Description: | Dizin : 197-202 s. |
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Physical Description: | xii, 202 sayfa ; 25 cm. |
Bibliography: | Kaynakça : 195-196 s. |
ISBN: | 9780387258003 |